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Surface Quality Inspection Systems
Surface Quality Inspection Systems(CV Series)
Surface Defect Inspection Systems(CV Series)
Product introduction
Key Features
Technical parameter
Application
Downloads
FAQ
Surface Quality Inspection Systems

Surface Quality Inspection Systems(CV Series)

The CV-2000 Series is a tool capable of performing high-precision dimensional measurement and continuous surface defect inspection simultaneously, meeting the current market demand for comprehensive online quality inspection of extruded products such as wire & cable, tubing, and wire rod.

The system is particularly suitable for surface quality inspection of flat enameled wire, enameled wire, wire & cable, tubing, and other products. It can detect defects including burns, coating loss, scratches, bulges, necking, wrinkles, tears, fish eyes, holes, spots, bubbles, streaks, color differences, and more.

Measurement Range
0.2~40mm
Measurement Data
Dimension Measurement, Lump & Neck Defect Detection, and Surface Visual Defect Inspection
Measurement Principle
Based on telecentric light source dimensional measurement and machine-learning-based surface defect detection technology
Application Industries
Wire & cable, fiber optic cables, flat enameled wire, etc

Product introduction

 

The CV-2000 Series delivers high-speed, high-precision dimensional measurement, along with exceptional lump & neck defect detection capability. It provides height information for surface defects, further enriching the dimension of defect data. Real-time feedback of product dimensional information on the production line enables operators to detect dimensional quality issues earlier and address them promptly.

    - One single device achieves precision dimensional measurement, lump & neck defect detection, and 360° continuous surface defect inspection

    - Up to 80 kHz high-speed, high-precision dimensional measurement and lump & neck defect detection

    - 4× 100 kHz high-speed color line-scan cameras to improve detection coverage

    - Advanced AI models and computer vision technology reduce miss rates and false alarm rates, accelerate on-site deployment, and save customer costs

    - Supports advanced defect classification for more accurate inspection results 

    - Detailed recording of trend data, statistical data, and defect data for easy analysis and traceability

    - Customizable alarm function, with alarm levels settable by defect category and defect size

    - Designed for industrial environments, featuring highly reliable electrical, illumination/imaging, thermal, and software systems for long-term stable operation 

    - Top-and-bottom opening design, motorized lift function, and more for easier daily use and maintenance

 
 

Key Features

High-Brightness Light Source

High-Brightness Light Source

Precision Dimensional Measurement

Precision Dimensional Measurement

Precision Dimensional Measurement

Top-and-Bottom Hinged Cover Design

Top-and-Bottom Hinged Cover Design

Top-and-Bottom Hinged Cover Design

Real-Time, Continuous Defect Detection

Real-Time, Continuous Defect Detection

Technical parameter

Category Item CV-2025Q CV-2040Q
Measurement Range Visual 0.2~25 mm 0.5~40 mm
Size 0.2~25 mm 0.5~65 mm
Size Measurement Axis and frequency 2-Axis, 80 KHz/Axis 2-Axis, 46 KHz/Axis
Repeatability ±0.1 μm⁽¹⁾ ±0.25 μm⁽¹⁾
Accuracy ±2 μm⁽²⁾ ±4 μm⁽³⁾
Surface Defects Measurement Surface Inspection 4-channel 100 kHz color line-scan cameras with 360° surface coverage 4-channel 100 kHz color line-scan cameras with 360° surface coverage
Miss Rate / False Detection Rate <1%⁽⁴⁾ <1%⁽⁴⁾
Minimum Defect Size Related to cameras, optical lens and production line speed; minimum size of 0.05 mm can be achieved⁽⁵⁾ Related to cameras, optical lens and production line speed; minimum size of 0.05 mm can be achieved⁽⁵⁾
Lump & Neck Measurement Min Defect Height 0.02 mm 0.04 mm
Min Defect Length 0.05 mm @ 240 m/min; 0.2 mm @ 960 m/min 0.1 mm @ 280 m/min; 0.2 mm @ 560 m/min; 0.5 mm @ 1400 m/min
Output Data Defect Type, Size, Length, Position Defect Type, Size, Length, Position
Maximum Line Speed Supported Depends on camera and lens configuration as well as minimum defect size; can be adapted for scenarios with line speeds below 200 m/min Depends on camera and lens configuration as well as minimum defect size; can be adapted for scenarios with line speeds below 200 m/min
Electrical Interface Digital output (relay), digital input Digital output (relay), digital input
Communication Interface RS485 (MODBUS RTU), TCP/IP, USB RS485 (MODBUS RTU), TCP/IP, USB
Power Supply 100–240 VAC, 50/60 Hz, Max. 1000 W 100–240 VAC, 50/60 Hz, Max. 1000 W
Working Temperature 5–45 °C 5–45 °C
Weight About 20 kg (measuring head); About 60 kg (all) About 32 kg (measuring head); About 72 kg (all)
IP Grade IP52 IP52

Application

Wire & Cable Surface Defect Inspection
 

Downloads

Technical documents such as product manuals, datasheets and outline drawings

PDF
CV-2000 Series Product BrochurePDF
⬇ Download

Frequently Asked Questions

Answers to frequently asked questions about Surface Quality Inspection Systems(CV Series)

Q Can enamelled wire particles be detected?

Yes. There are two main solutions:

Lump/Neckdown Detection: The F Series, TL-2000 Series, and TL-3000 Series all support lump/neckdown detection. The TL-3000 Series offers a sampling rate of up to 80 kHz, making it suitable for high-speed production and supporting defect imaging.

Surface Defect Inspection: The surface defect inspection system can visually detect particles and other surface abnormalities on enamelled wire.

Q What surface defects can be detected on enamelled wire?

The surface defect inspection system can detect defects such as burn marks, bulges, neckdowns, wrinkles, and bubbles.

Q Can the system detect bulges on tubing?

Yes. Several DALA products support lump/neckdown defect detection and can detect local bulges on tubing.

Q Can 3D printing filaments of different colors be measured for diameter?

Yes. DALA diameter gauges can measure 3D printing filaments in different colors.

Q Can the system detect surface defects, diameter, and lump/neckdown defects simultaneously?
Yes. A single surface defect inspection system can perform 360° surface defect inspection, precision dimensional measurement, and lump/neckdown detection simultaneously.
Q What technologies are used for surface defect and lump/neckdown detection in DALA’s inspection system?

Surface defects are detected using AI models and computer vision technology, while diameter and lump/neckdown detection use telecentric optical technology.

Q What are the minimum detectable surface defect size and lump/neckdown height?

The minimum detectable surface defect size varies with lens magnification, while the minimum detectable lump/neckdown height depends on the sampling rate.

Typical values are:

  • Surface defects: at 1× magnification, the minimum detectable defect size is approximately 0.05 × 0.05 mm.
  • Lump/neckdown defects: at a sampling rate of 80 kHz, the minimum detectable height is approximately 0.01 mm.

For specific applications, please refer to the product selection guide and the Surface Defect Inspection System Brochure, or contact our sales/technical support team for configuration recommendations.

Q What is the maximum line speed supported by the surface defect inspection system?

Currently, the maximum supported line speed is 300 m/min. The actual maximum speed depends on the system configuration.

Fast Delivery & Comprehensive Support

Provides end-to-end support from product selection to production line operation through on-site guidance and after-sales technical support.